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Research themes

Degree of Molecular Order

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  • Advantages over X-ray based techniques

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Chemical Compositions

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Electrical stability

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In-situ monitoring of phase changes

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Molecular Orientation

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Natures of Electronic Transitions

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Photostability

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Nanometrology Tools

Confocal Raman- AFM Spectroscopy

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5 laser excitation wavelengths (457 - 785 nm)
Steamlined 3D mapping
Angle dependent polarisation control
Confocal fluorescence
Surface Enhanced Raman Spectroscopy (SERS)
Tip Enhanced Raman Spectroscopy (TERS)
In Situ Pressure Dependent Raman Spectroscopy
In Situ Temperature Dependent Raman Spectroscopy (77 - 600 K)
In Situ Device Operation
In Situ Cyclic Voltammetry
In Situ Electrochemical Degradation

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Summary of the table's contents

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Scanning Probe Microscopy

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Non-Contact Atomic Force Microscopy
Tapping Mode Atomic Force Microscopy
Scanning Kelvin Probe Microscopy
Conductive Atomic Force Microscopy
Magnetic Force Microscopy
Piezo Force Microscopy
Summary of the table's contents

Ellipsometry

We have a range of other nanoanalysis techniques to let us look at the vibrational and electronic energy levels of materials. We can track the formation of excitons through our materials and blends.

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Fourier Transform Infrared Spectroscopy
UV-Visible Absorption Spectroscopy
Polarized UV-Visible Absorption Spectroscopy
Photoluminescence
Transient Absorption Spectroscopy
 
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Illumination wavelengths (200nm-20um) 
Spectroscopic Ellipsometry
FT-IR Ellipsometry & Spectroscopy
Summary of the table's contents

KP, SPS and APS

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QTH source has wavelength range from 400-1000 nm.
In-situ temperature stage (293-500K)
UHV cube for air sensitive samples
APS allows density of states (DoS) measurement.
APS energy range: 3.4 eV - 7.0 eV (360 nm - 176 nm)
50μm gold tip available for higher resolution scanning kelvin probe microscopy measurements

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