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Degree of Molecular Order
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Advantages over X-ray based techniques
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In-situ monitoring of phase changes
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Natures of Electronic Transitions
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Confocal Raman- AFM Spectroscopy
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|5 laser excitation wavelengths (457 - 785 nm)|
|Steamlined 3D mapping|
|Angle dependent polarisation control|
|Surface Enhanced Raman Spectroscopy (SERS)|
|Tip Enhanced Raman Spectroscopy (TERS)|
|In Situ Pressure Dependent Raman Spectroscopy|
|In Situ Temperature Dependent Raman Spectroscopy (77 - 600 K)|
|In Situ Device Operation|
|In Situ Cyclic Voltammetry|
|In Situ Electrochemical Degradation|
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Scanning Probe Microscopy
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|Non-Contact Atomic Force Microscopy|
|Tapping Mode Atomic Force Microscopy|
|Scanning Kelvin Probe Microscopy|
|Conductive Atomic Force Microscopy|
|Magnetic Force Microscopy|
|Piezo Force Microscopy|
We have a range of other nanoanalysis techniques to let us look at the vibrational and electronic energy levels of materials. We can track the formation of excitons through our materials and blends.
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|Fourier Transform Infrared Spectroscopy|
|UV-Visible Absorption Spectroscopy|
|Polarized UV-Visible Absorption Spectroscopy|
|Transient Absorption Spectroscopy|
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|Illumination wavelengths (200nm-20um)|
|FT-IR Ellipsometry & Spectroscopy|
KP, SPS and APS
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|QTH source has wavelength range from 400-1000 nm.|
|In-situ temperature stage (293-500K)|
|UHV cube for air sensitive samples|
|APS allows density of states (DoS) measurement.|
|APS energy range: 3.4 eV - 7.0 eV (360 nm - 176 nm)|
|50μm gold tip available for higher resolution scanning kelvin probe microscopy measurements|
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